Status and review of 2-D carrier profiling using scanning probe microscopy

De Wolf, PeterPeterDe WolfStephenson, RobertRobertStephensonTrenkler, ThomasThomasTrenklerClarysse, TrudoTrudoClarysseHantschel, ThomasThomasHantschelVandervorst, WilfriedWilfriedVandervorst2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3391Status and review of 2-D carrier profiling using scanning probe microscopyProceedings paper