Evaluation of Sn-based microbumping technology for hybrid IR detectors, 10μm pitch to 5μm pitch

Soussan, PhilippePhilippeSoussanMajeed, BivraghBivraghMajeedLe Boterf, P.P.Le BoterfBouillon, P.P.Bouillon2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25932Evaluation of Sn-based microbumping technology for hybrid IR detectors, 10μm pitch to 5μm pitchProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7159652