Brammertz, GuyGuyBrammertzLin, DennisDennisLinMartens, KoenKoenMartensMercier, DavidDavidMercierSioncke, SonjaSonjaSionckeDelabie, AnneliesAnneliesDelabieWang, Wei-EWei-EWangCaymax, MattyMattyCaymaxMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-172021-10-1720080003-6951https://imec-publications.be/handle/20.500.12860/13443Capacitance-voltage characterization of GaAs-Al2O3 interfacesJournal articlehttp://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000093000018183504000001&idtype=cvips