Designing the ideal transition-metal-oxide-based RRAM stack from first-principles thermodynamics and defect kinetics

Clima, SergiuSergiuClimaChen, YangyinYangyinChenFantini, AndreaAndreaFantiniChen, MichaelMichaelChenGoux, LudovicLudovicGouxGovoreanu, BogdanBogdanGovoreanuDegraeve, RobinRobinDegraeveJurczak, GosiaGosiaJurczakPourtois, GeoffreyGeoffreyPourtois2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25088Designing the ideal transition-metal-oxide-based RRAM stack from first-principles thermodynamics and defect kineticsMeeting abstract