Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors

Claeys, CorCorClaeysSimoen, EddyEddySimoenSrinivasan, PurushothamanPurushothamanSrinivasanMisra, D.D.Misra2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/11883Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistorsJournal article