Atomically precise impurity identification and modification on the manganese doped GaAs(110) surface with scanning tunneling microscopy

Garleff, J. K.J. K.GarleffCelebi, C.C.CelebiVan Roy, WimWimVan RoyTang, J. M.J. M.TangFlatte, M. E.M. E.FlatteKoenraad, P. M.P. M.Koenraad2021-10-172021-10-172008-081098-0121https://imec-publications.be/handle/20.500.12860/13751Atomically precise impurity identification and modification on the manganese doped GaAs(110) surface with scanning tunneling microscopyJournal articlehttp://link.aps.org/abstract/PRB/v78/e075313