Liu, LifangLifangLiuArreghini, AntonioAntonioArreghiniVan den Bosch, GeertGeertVan den BoschPan, LiyangLiyangPanVan Houdt, JanJanVan Houdt2021-10-232021-10-2320160038-1101https://imec-publications.be/handle/20.500.12860/26919Comprehensive understanding of charge lateral migration in 3D SONOS memoriesJournal articlehttp://www.sciencedirect.com/science/article/pii/S003811011500355X