Single atom detection from low contrast-to-noise ratio electron microscopy images

Fatermans, J.J.Fatermansden Dekker, Arnold JanArnold Janden DekkerMüller-Caspary, K.K.Müller-CasparyLobato, IvanIvanLobatoO'Leary, C. M.C. M.O'LearyNellist, Peter D.Peter D.NellistVan Aert, SandraSandraVan Aert2021-10-252021-10-252018-070031-9007https://imec-publications.be/handle/20.500.12860/30695Single atom detection from low contrast-to-noise ratio electron microscopy imagesJournal articlehttps://journals.aps.org/prl/abstract/10.1103/PhysRevLett.121.056101