Ichihara, ReikaReikaIchiharaPesic, Milan D.Milan D.PesicHigashi, YusukeYusukeHigashiPark, Min HyukMin HyukPark2026-01-222026-01-222025-09-160883-7694https://imec-publications.be/handle/20.500.12860/58708engReliability of HfO2-based FeFET memoryJournal article review10.1557/s43577-025-00967-yWOS:001572026000001