Kan, DuyguDuyguKanDe Ridder, SimonSimonDe RidderSpina, DomenicoDomenicoSpinaDhaene, TomTomDhaeneRogier, HendrikHendrikRogierVande Ginste, DriesDriesVande GinsteGrassi, FlaviaFlaviaGrassi2022-01-052021-11-022022-01-0520202475-9481WOS:000628989600009https://imec-publications.be/handle/20.500.12860/38051A Machine Learning-Based Epistemic Modeling Framework for EMC and SI AssessmentProceedings paper978-1-7281-4204-3WOS:000628989600009VARIABILITY ANALYSISPOLYNOMIAL-CHAOS