Damaging species in the hole injection induced electron trap generation

Chang, M.H.M.H.ChangZhang, J.F.J.F.ZhangGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeve2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7307Damaging species in the hole injection induced electron trap generationOral presentation