Acurio Mendez, ElianaElianaAcurio MendezTrojman, LionelLionelTrojmanCrupi, FeliceFeliceCrupiIucolano, FerdinandoFerdinandoIucolanoRonchi, NicoloNicoloRonchiDe Jaeger, BriceBriceDe JaegerBakeroot, BenoitBenoitBakerootDecoutere, StefaanStefaanDecoutere2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30064Reliability in GaN-based devices for power applicationsProceedings paperhttps://ieeexplore.ieee.org/document/8593328