Study of SiGeAsTe and SiGeAsSe chalcogenide thin films by Raman spectroscopy and understanding of their OTS properties

Keukelier, JonasJonasKeukelierDevulder, WouterWouterDevulderSergeant, StefanieStefanieSergeantNuytten, ThomasThomasNuyttenMeersschaut, JohanJohanMeersschautOpsomer, KarlKarlOpsomerDetavernier, ChristopheChristopheDetavernier2025-07-082024-09-042025-07-0820240022-3093WOS:001299281400001https://imec-publications.be/handle/20.500.12860/44400Study of SiGeAsTe and SiGeAsSe chalcogenide thin films by Raman spectroscopy and understanding of their OTS propertiesJournal article10.1016/j.jnoncrysol.2024.123175WOS:001299281400001SHORT-RANGE ORDERGLASSESSBCRYSTALLINESCATTERING