Degraeve, RobinRobinDegraeveOgier, Jean-LucJean-LucOgierBellens, RudiRudiBellensRoussel, PhilippePhilippeRousselGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2526A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdownJournal article