Janssens, KoenraadKoenraadJanssensVan Der Biest, O.O.Van Der BiestVanhellemont, JanJanVanhellemontMaes, HermanHermanMaes2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/207Nanoscale strain characterization using transmission electron microscopy: The software package SIMCONProceedings paper