Failure rate predictions for 0.35μm flash EEPROM memories from accelerated read disturb tests

Vermeulen, TomTomVermeulenYao, ThierryThierryYaoLowe, AntonyAntonyLoweCacharelis, PhilippePhilippeCacharelisDegraeve, RobinRobinDegraeveVan Houdt, JanJanVan Houdt2021-10-152021-10-152004-09https://imec-publications.be/handle/20.500.12860/9877Failure rate predictions for 0.35μm flash EEPROM memories from accelerated read disturb testsProceedings paper