Bellens, RudiRudiBellensHabas, PredragPredragHabasGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaesMieville, Jean-PaulJean-PaulMievilleVan den bosch, G.G.Van den bosch2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/517Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devicesJournal article