Fernandez, RaulRaulFernandezKaczer, BenBenKaczerGago, J.J.GagoRodriguez, RosanaRosanaRodriguezNafria, MontserratMontserratNafria2021-10-172021-10-172009-02https://imec-publications.be/handle/20.500.12860/15303Experimental characterization of NBTI effect on pMOSFET and CMOS inverterProceedings paper