p-n junction diagnostics to determine surface and bulk generation/recombination properties of silicon substrates

Claeys, CorCorClaeysPoyai, AmpornAmpornPoyaiSimoen, EddyEddySimoenCzerwinski, A.A.CzerwinskiKatcki, J.J.Katcki2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3296p-n junction diagnostics to determine surface and bulk generation/recombination properties of silicon substratesJournal article