Study of electron-irradiated IGBTs by the DCIV method and lifetime

Nakabayashi, M.M.NakabayashiOhyama, H.H.OhyamaNanao, N.N.NanaoHirao, T.T.HiraoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9340Study of electron-irradiated IGBTs by the DCIV method and lifetimeProceedings paper