Gupta, SomyaSomyaGuptaShimura, YosukeYosukeShimuraRichard, OlivierOlivierRichardDouhard, BastienBastienDouhardSimoen, EddyEddySimoenBender, HugoHugoBenderNakatsuka, OsamaOsamaNakatsukaZaima, ShigeakiShigeakiZaimaLoo, RogerRogerLooHeyns, MarcMarcHeyns2021-10-252021-10-252018-100003-6951https://imec-publications.be/handle/20.500.12860/30827Defect evaluation in strain-relaxed Ge0.947Sn0.053 grown on (001) SiJournal articlehttps://doi.org/10.1063/1.5048683