Martino, J.A.J.A.MartinoPavanello, M.A.M.A.PavanelloSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14136Strain influence of analog performance of single-gate and FinFET SOI nMOSFETsProceedings paper