Jin, S.S.JinBender, HugoHugoBenderLi, XiuqiongXiuqiongLiDong, C.C.DongZhang, ZhengZhengZhang2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1285Transmission electron microscopic study of new FeSi2 and TiSi2 phases prepared by ion implantationOral presentation