O'Connor, RobertRobertO'ConnorHughes, GregGregHughesDegraeve, RobinRobinDegraeveKaczer, BenBenKaczer2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10947Charge trapping in MOSFETs with HfSiON dielectrics during electrical stressingJournal article