Nakabayashi, M.M.NakabayashiOhyama, H.H.OhyamaTakakura, K.K.TakakuraSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7924Model for the radiation degradation of polycrystalline silicon filmsJournal article