Saraza Canflanca, PabloPabloSaraza CanflancaMartin-Martinez, J.J.Martin-MartinezRoca, E.E.RocaCastro-Lopez, R.R.Castro-LopezRodriguez, R.R.RodriguezNafria, M.M.NafriaFernandez, F. V.F. V.Fernandez2026-03-232026-03-2320222575-4874https://imec-publications.be/handle/20.500.12860/58918This paper addresses the automated parameter extraction of Random Telegraph Noise (RTN) models in nanoscale field-effect transistors. Unlike conventional approaches based on complex extraction of current levels and timing of trapping/de-trapping events from individual defects in current traces, the proposed approach performs a simple processing of current traces. A smart optimization problem formulation allows getting distribution functions of the amplitude of the current shifts and of the number of active defects vs. time.engProceedings paper10.1109/smacd55068.2022.9816234WOS:001564543800016TIME-DEPENDENT VARIABILITYSTATISTICAL CHARACTERIZATION