Saleh, AhmedAhmedSalehZahedmanesh, HoumanHoumanZahedmaneshCeric, H.H.CericDe Wolf, IngridIngridDe WolfCroes, KristofKristofCroes2024-05-232023-07-152024-05-2320231541-7026WOS:001007431500106https://imec-publications.be/handle/20.500.12860/42158Impact of via geometry and line extension on via-electromigration in nano-interconnectsProceedings paper10.1109/IRPS48203.2023.10118027978-1-6654-5672-2WOS:001007431500106EVOLUTIONMODEL