Scanning Probe Microscopy as a scalpel to probe filament formation in RRAM devices

Celano, UmbertoUmbertoCelanoGoux, LudovicLudovicGouxOpsomer, KarlKarlOpsomerIapichino, MartinaMartinaIapichinoFranquet, AlexisAlexisFranquetHoflijk, IlseIlseHoflijkJurczak, GosiaGosiaJurczakVandervorst, WilfriedWilfriedVandervorst2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22116Scanning Probe Microscopy as a scalpel to probe filament formation in RRAM devicesMeeting abstract