A comparison of various terminal-gate relationships for interconnect prediction in VLSI circuits

Dambre, JoniJoniDambreVerplaetse, PeterPeterVerplaetseStroobandt, DirkDirkStroobandtVan Campenhout, JanJanVan Campenhout2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7378A comparison of various terminal-gate relationships for interconnect prediction in VLSI circuitsJournal article