Duan, M.M.DuanZhang, J. F.J. F.ZhangJi, Z.Z.JiZhang, W.W.ZhangKaczer, BenBenKaczerDe Gendt, StefanStefanDe GendtGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-2020120741-3106https://imec-publications.be/handle/20.500.12860/20629Defect loss: a new concept for reliability of MOSFETsJournal articlehttp://dx.doi.org/10.1109/LED.2012.2185033