Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits

Zenari, MicheleMicheleZenariBuffolo, MatteoMatteoBuffoloFornasier, MirkoMirkoFornasierDe Santi, CarloCarloDe SantiGoyvaerts, JeroenJeroenGoyvaertsGrabowski, AlexanderAlexanderGrabowskiGustavsson, JohanJohanGustavssonKumari, SulakshnaSulakshnaKumariStassen, AndimAndimStassenBaets, RoelRoelBaetsLarsson, AndersAndersLarssonRoelkens, GuntherGuntherRoelkensMeneghesso, GaudenzioGaudenzioMeneghessoZanoni, EnricoEnricoZanoniMeneghini, MatteoMatteoMeneghini2023-08-092023-07-082023-08-0920230018-9197WOS:001016754600001https://imec-publications.be/handle/20.500.12860/42135Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated CircuitsJournal article10.1109/JQE.2023.3283514WOS:001016754600001FAILURE