Low-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2

Simoen, EddyEddySimoenHellings, GeertGeertHellingsParvais, BertrandBertrandParvaisRagnarsson, Lars-AkeLars-AkeRagnarssonDekkers, HaroldHaroldDekkersSchram, TomTomSchramLinten, DimitriDimitriLintenHoriguchi, NaotoNaotoHoriguchi2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/31784Low-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2Proceedings paper