Kubicek, StefanStefanKubicekLyu, Jeong-hoJeong-hoLyuDe Meyer, KristinKristinDe Meyer2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2684Explanation of the "long distance" Vt roll-off in deep submicron nMOS transistors with Indium channelProceedings paper