Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages

Cron, AdamAdamCronJiao, HailongHailongJiaoMarinissen, Erik JanErik JanMarinissen2022-12-222022-09-162022-12-2220222168-2356WOS:000850868500005https://imec-publications.be/handle/20.500.12860/40433Guest Editors' Introduction: Special Issue on Design and Test of Multidie PackagesEditorial material10.1109/MDAT.2022.3192358WOS:000850868500005