On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material properties

Vanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenClaeys, CorCorClaeysKaniava, ArvydasArvydasKaniavaGaubas, EugenijusEugenijusGaubasBosman, GijsGijsBosmanJohlander, B.B.JohlanderAdams, L.L.AdamsClauws, P.P.Clauws2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/429On the impact of low fluence irradiation with MeV particles on silicon diode characteristics and related material propertiesJournal article