Verhoeve, PietPietVerhoeveDiet, GeertGeertDietSarlet, GertGertSarletMorthier, GeertGeertMorthierBaets, RoelRoelBaetsFarrell, T.T.Farrell2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2288OLIMPEX: measurement and parameter extraction tools for advanced laser diodesProceedings paper