Hot carrier degradation and time-dependent dielectric breakdown in oxides

Groeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeveNigam, TanyaTanyaNigamVan den bosch, G.G.Van den boschMaes, HermanHermanMaes2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3477Hot carrier degradation and time-dependent dielectric breakdown in oxidesJournal article