Lee, Jae WooJae WooLeeCho, Moon JuMoon JuChoSimoen, EddyEddySimoenRitzenthaler, RomainRomainRitzenthalerTogo, MitsuhiroMitsuhiroTogoBoccardi, GuillaumeGuillaumeBoccardiMitard, JeromeJeromeMitardRagnarsson, Lars-AkeLars-AkeRagnarssonChiarella, ThomasThomasChiarellaVeloso, AnabelaAnabelaVelosoHoriguchi, NaotoNaotoHoriguchiThean, AaronAaronTheanGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-212013-030003-6951https://imec-publications.be/handle/20.500.12860/226581/f noise analysis of replacement metal gate bulk p-type fin field effect transistorJournal articlehttp://apl.aip.org/resource/1/applab/v102/i7/p073503_s1