Electrical defects in dielectrics for flash memories studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIC)

Degraeve, RobinRobinDegraeveCho, Moon JuMoon JuChoGovoreanu, BogdanBogdanGovoreanuKaczer, BenBenKaczerZahid, MohammedMohammedZahidVan den Bosch, GeertGeertVan den BoschVan Houdt, JanJanVan HoudtJurczak, GosiaGosiaJurczakGroeseneken, GuidoGuidoGroeseneken2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/15211Electrical defects in dielectrics for flash memories studied by Trap Spectroscopy by Charge Injection and Sensing (TSCIC)Proceedings paper