Two-dimensional carrier mapping in nanowire-based heterojunction tunnel-field effect transistors using scanning spreading resistance microscopy

Schulze, AndreasAndreasSchulzeHantschel, ThomasThomasHantschelEyben, PierrePierreEybenVerhulst, AnneAnneVerhulstRooyackers, RitaRitaRooyackersVandooren, AnneAnneVandoorenVandervorst, WilfriedWilfriedVandervorst2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21482Two-dimensional carrier mapping in nanowire-based heterojunction tunnel-field effect transistors using scanning spreading resistance microscopyMeeting abstract