Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions

Groeseneken, GuidoGuidoGroesenekenBellens, RudiRudiBellensVan den Bosch, GeertGeertVan den BoschMaes, HermanHermanMaes2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/665Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditionsJournal article