Optimization of test-access architecture and test scheduling for 3D ICs

Deutsch, SergejSergejDeutschNoia, BrandonBrandonNoiaChakrabarty, KrishnenduKrishnenduChakrabartyMarinissen, Erik JanErik JanMarinissen2021-10-272021-10-272019-03https://imec-publications.be/handle/20.500.12860/32881Optimization of test-access architecture and test scheduling for 3D ICsBook chapterhttps://doi.org/10.1002/9783527697052.ch13