Izmailov, R. A.R. A.IzmailovO'Sullivan, BarryBarryO'SullivanPopovici, Mihaela IoanaMihaela IoanaPopoviciAfanas'ev, V. V.V. V.Afanas'ev2022-09-012022-06-232022-09-0120220038-1101WOS:000807746600001https://imec-publications.be/handle/20.500.12860/40003Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO4Journal article10.1016/j.sse.2022.108388WOS:000807746600001KAPPA