Insight into the mechanism of tail bits in data retention of vacancy-modulated conductive oxide RRAM

Koh, Sang GyuSang GyuKohKurihara, KazuakiKazuakiKuriharaBelmonte, AttilioAttilioBelmontePopovici, Mihaela IoanaMihaela IoanaPopoviciDonadio, Gabriele LucaGabriele LucaDonadioGoux, LudovicLudovicGouxKar, Gouri SankarGouri SankarKar2021-10-252021-10-2520180741-3106https://imec-publications.be/handle/20.500.12860/31067Insight into the mechanism of tail bits in data retention of vacancy-modulated conductive oxide RRAMJournal articlehttps://ieeexplore.ieee.org/document/8304702/