Scholten, AndriesAndriesScholtenTiemeijer, LuukLuukTiemeijerZegers-van Duijnhoven, A.T.A.A.T.A.Zegers-van DuijnhovenHavens, R.J.R.J.Havensde Kort, R.R.de Kortvan Langevelde, R.R.van LangeveldeKlaassen, DickDickKlaassenJeamsaksiri, WutthinanWutthinanJeamsaksiriVelghe, R.D.M.A.R.D.M.A.Velghe2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11176Modeling and characterization of noise in 90nm CMOS technologyProceedings paper