Brammertz, GuyGuyBrammertzAlian, AliRezaAliRezaAlianLin, DennisDennisLinNyns, LauraLauraNynsSioncke, SonjaSonjaSionckeMerckling, ClementClementMercklingWang, Wei-EWei-EWangCaymax, MattyMattyCaymaxHoffmann, Thomas Y.Thomas Y.Hoffmann2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18621Electrical quality of III-V/oxide interfaces: good enough for MOSFET devices?Proceedings paper