Perspective on III-V Tunnel-FETs: bridging the gap between ideal device design and experimental realizations through calibration

Verhulst, AnneAnneVerhulstSmets, QuentinQuentinSmetsBizindavyi, JasperJasperBizindavyiVerreck, DevinDevinVerreckEl Kazzi, SalimSalimEl KazziAlian, AliRezaAliRezaAlianFranco, JacopoJacopoFrancoMols, YvesYvesMolsVandooren, AnneAnneVandoorenRooyackers, RitaRitaRooyackersLin, DennisDennisLinMocuta, AndaAndaMocutaSoree, BartBartSoreeGroeseneken, GuidoGuidoGroesenekenCollaert, NadineNadineCollaertHeyns, MarcMarcHeyns2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27531Perspective on III-V Tunnel-FETs: bridging the gap between ideal device design and experimental realizations through calibrationMeeting abstract