Cova, P.P.CovaMenozzi, R.R.MenozziLacey, D.D.LaceyBaeyens, YvesYvesBaeyensFantini, F.F.Fantini2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/572Hot electron degradation effects in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs PHEMTsProceedings paper