Kaczer, BenBenKaczerMahato, SwarajSwarajMahatoValduga de Almeida Camargo, ViniciusViniciusValduga de Almeida CamargoToledano Luque, MariaMariaToledano LuqueRoussel, PhilippePhilippeRousselGrasser, TiborTiborGrasserCatthoor, FranckyFranckyCatthoorDobrovolny, PetrPetrDobrovolnyZuber, PaulPaulZuberWirth, GilsonGilsonWirthGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-192011-04https://imec-publications.be/handle/20.500.12860/19148Atomistic approach to variability of bias-temperature instability in circuit simulationsProceedings paper