Bender, HugoHugoBenderJin, S.S.JinPoortmans, JefJefPoortmansStalmans, LievenLievenStalmans2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3227Morphological properties of porous-Si layers for n+-emitter applicationsJournal article